Please use this identifier to cite or link to this item: http://bura.brunel.ac.uk/handle/2438/32456
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dc.contributor.authorHe, Y-
dc.contributor.authorWang, Z-
dc.contributor.authorLiu, W-
dc.contributor.authorFang, J-
dc.contributor.authorChen, L-
dc.contributor.authorSong, Z-
dc.date.accessioned2025-12-05T09:36:02Z-
dc.date.available2025-12-05T09:36:02Z-
dc.date.issued2025-11-13-
dc.identifierORCiD: Yimeng He https://orcid.org/0000-0002-5104-2484-
dc.identifierORCiD: Zidong Wang https://orcid.org/0000-0002-9576-7401-
dc.identifierORCiD: Weibo Liu https://orcid.org/0000-0002-8169-3261-
dc.identifierORCiD: Jingzhong Fang https://orcid.org/0000-0002-3037-3479-
dc.identifierORCiD: Linwei Chen https://orcid.org/0009-0008-2328-038X-
dc.identifierORCiD: Zhihuan Song https://orcid.org/0000-0003-4098-6479-
dc.identifier.citationHe, Y. et al (2025) 'Label-Noise-Resistant Time-Series Classification With Self-Supervised Label Correction', IEEE Transactions on Industrial Informatics, 0 (early access), pp. 1 - 12. doi: 10.1109/TII.2025.3626697.en_US
dc.identifier.issn1551-3203-
dc.identifier.urihttsp://bura.brunel.ac.uk/handle/2438/32456-
dc.description.abstractThe reliable operation of industrial systems requires not only the prompt detection of faults but also their accurate classification into the appropriate categories. At present, numerous data-driven industrial fault detection and diagnosis models, which have been developed based on historical fault data, frequently neglect the issue of label noise. When labels are corrupted by noise, a significant degradation in the performance of industrial fault detection models can be observed. In this article, a label-noise-resistant time-series classification (LNRTSC) method based on consistency-driven label correction is proposed. First, an attention-based temporal correlation-enhanced encoder is introduced to extract low-dimensional representations of industrial time series. Then, label confidence, which is assessed based on local label consistency, is utilized to correct noisy labels during training. In addition, a two-stage self-supervised enhancement strategy is designed to guarantee the reliability of the corrected labels. Specifically, a reconstruction loss term is introduced to assist feature extraction in the warming-up stage, and a newly designed contrastive loss term is added to the loss function for the LNL training stage, which mitigates the effect of false negatives. Finally, the effectiveness of the LNRTSC method is validated on the Tennessee Eastman process and the SEU-gearbox datasets. When compared to peer methods, the LNRTSC approach demonstrates substantial improvements in fault classification performance on corrupted data.en_US
dc.description.sponsorship10.13039/501100001809-National Natural Science Foundation of China (Grant Number: 62473103); Royal Society of the U.K.; Alexander von Humboldt Foundation of Germany.en_US
dc.format.extent1 - 12-
dc.languageEnglish-
dc.language.isoen_USen_US
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)en_US
dc.rightsCopyright © 2025 Institute of Electrical and Electronics Engineers (IEEE). Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works ( https://journals.ieeeauthorcenter.ieee.org/become-an-ieee-journal-author/publishing-ethics/guidelines-and-policies/post-publication-policies/ ).-
dc.rights.urihttps://journals.ieeeauthorcenter.ieee.org/become-an-ieee-journal-author/publishing-ethics/guidelines-and-policies/post-publication-policies/-
dc.subjectindustrial fault detectionen_US
dc.subjectlabel correction (LC)en_US
dc.subjectlearning with noisy labels (LNL)en_US
dc.subjectself-supervised learningen_US
dc.subjecttime-series classificationen_US
dc.titleLabel-Noise-Resistant Time-Series Classification With Self-Supervised Label Correctionen_US
dc.typeArticleen_US
dc.date.dateAccepted2025-10-22-
dc.identifier.doihttps://doi.org/10.1109/TII.2025.3626697-
dc.relation.isPartOfIEEE Transactions on Industrial Informatics-
pubs.issue0-
pubs.publication-statusPublished-
pubs.volume00-
dc.identifier.eissn1941-0050-
dcterms.dateAccepted2025-10-22-
dc.rights.holderInstitute of Electrical and Electronics Engineers (IEEE)-
Appears in Collections:Dept of Computer Science Research Papers

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