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http://bura.brunel.ac.uk/handle/2438/341
Title: | Improved test quality using robust unique input/output circuit sequences (UIOCs) |
Authors: | Guo, Q Hierons, RM Harman, M Derderian, K |
Keywords: | FSMs;Conformance test;F-UIOs;B-UIOs;UIOCs;Fault masking;Test quality |
Issue Date: | 2005 |
Publisher: | Elsevier |
Citation: | Information and Software Technology, 48 (8): 696-707, Jul 2005 |
Abstract: | In finite state machine (FSM) based testing, the problem of fault masking in the unique input/ output (UIO) sequence may degrade the test performance of the UIO based methods. This paper investigates this problem and proposes the use of a new type of unique input/output circuit (UIOC) sequence for state verification, which may help to overcome the drawbacks that exist in the UIO based techniques. When constructing a UIOC, overlap and internal state observation schema are used to increase the robustness of a test sequence. Test quality is compared by using the forward UIO method (F-method), the backward UIO method (B-method) and the UIOC method (C-method) separately. Robustness of the UIOCs constructed by the algorithm given in this paper is also compared with those constructed by the algorithm given previously. Experimental results suggest that the C-method outperforms the F- and the B-methods and the UIOCs constructed by the Algorithm given in this paper, are more robust than those constructed by other proposed algorithms. |
URI: | http://www.elsevier.com/wps/find/journaldescription.cws_home/525444/description#description http://bura.brunel.ac.uk/handle/2438/341 |
Appears in Collections: | Computer Science Dept of Computer Science Research Papers Software Engineering (B-SERC) |
Files in This Item:
File | Description | Size | Format | |
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Improving Test Qualilty 2006.pdf | 715.2 kB | Adobe PDF | View/Open |
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