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Title: Measuring center of pressure signals to quantify human balance using multivariate multiscale entropy by designing a force platform
Authors: Huang, C-W
Sue, P-D
Abbod, MF
Jiang, BC
Shieh, J-S
Keywords: Center of pressure (COP);Multivariate empirical mode decomposition (MEMD);Multivariate multiscale entropy (MMSE)
Issue Date: 2013
Publisher: MDPI AG
Citation: Sensors, 13(8), 10151 - 10166, 2013
Abstract: To assess the improvement of human body balance, a low cost and portable measuring device of center of pressure (COP), known as center of pressure and complexity monitoring system (CPCMS), has been developed for data logging and analysis. In order to prove that the system can estimate the different magnitude of different sways in comparison with the commercial Advanced Mechanical Technology Incorporation (AMTI) system, four sway tests have been developed (i.e., eyes open, eyes closed, eyes open with water pad, and eyes closed with water pad) to produce different sway displacements. Firstly, static and dynamic tests were conducted to investigate the feasibility of the system. Then, correlation tests of the CPCMS and AMTI systems have been compared with four sway tests. The results are within the acceptable range. Furthermore, multivariate empirical mode decomposition (MEMD) and enhanced multivariate multiscale entropy (MMSE) analysis methods have been used to analyze COP data reported by the CPCMS and compare it with the AMTI system. The improvements of the CPCMS are 35% to 70% (open eyes test) and 60% to 70% (eyes closed test) with and without water pad. The AMTI system has shown an improvement of 40% to 80% (open eyes test) and 65% to 75% (closed eyes test). The results indicate that the CPCMS system can achieve similar results to the commercial product so it can determine the balance.
Description: Copyright @ 2013 by the authors; licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution license (
ISSN: 1424-8220
Appears in Collections:Electronic and Computer Engineering
Dept of Electronic and Computer Engineering Research Papers

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