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DC Field | Value | Language |
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dc.contributor.author | Wang, BX | - |
dc.contributor.author | Yu, K | - |
dc.contributor.author | Sheng, Z | - |
dc.date.accessioned | 2015-01-19T12:53:13Z | - |
dc.date.available | 2014 | - |
dc.date.available | 2015-01-19T12:53:13Z | - |
dc.date.issued | 2014 | - |
dc.identifier.citation | IEEE Transactions on Reliability, 63 (3): 807 - 815, (2014) | en_US |
dc.identifier.issn | 0018-9529 | - |
dc.identifier.uri | http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6782725 | - |
dc.identifier.uri | http://bura.brunel.ac.uk/handle/2438/9799 | - |
dc.description | This article has been made available through the Brunel Open Access Publishing Fund. | - |
dc.description.abstract | Constant-stress procedures based on parametric lifetime distributions and models are often used for accelerated life testing in product reliability experiments. Maximum likelihood estimation (MLE) is the typical statistical inference method. This paper presents a new inference method, named the random variable transformation (RVT) method, for Weibull constant-stress accelerated life tests with progressively Type-II right censoring (including ordinary Type-II right censoring). A two-parameter Weibull life distribution with a scale parameter that is a log-linear function of stress is used. RVT inference life distribution parameters and the log-linear function coefficients are provided. Exact confidence intervals for these parameters are also explored. Numerical comparisons of RVT-based estimates to MLE show that the proposed RVT inference is promising, in particular for small sample sizes. | en_US |
dc.format.extent | 807 - 815 | - |
dc.format.extent | 807 - 815 | - |
dc.language | eng | - |
dc.language.iso | en | en_US |
dc.publisher | Institute of Electrical and Electronics Engineers Inc. | en_US |
dc.subject | Accelerated life-testing | en_US |
dc.subject | Censored data | en_US |
dc.subject | Confidence interval | en_US |
dc.subject | Maximum likelihood estimation | en_US |
dc.subject | Progressively censoring | en_US |
dc.subject | Random variable transformation | en_US |
dc.subject | Weibull distribution | en_US |
dc.title | New inference for constant-stress accelerated life tests with Weibull distribution and progressively type-II censoring | en_US |
dc.type | Article | en_US |
dc.identifier.doi | http://dx.doi.org/10.1109/TR.2014.2313804 | - |
dc.relation.isPartOf | IEEE Transactions on Reliability | - |
dc.relation.isPartOf | IEEE Transactions on Reliability | - |
pubs.issue | 3 | - |
pubs.issue | 3 | - |
pubs.volume | 63 | - |
pubs.volume | 63 | - |
pubs.organisational-data | /Brunel | - |
pubs.organisational-data | /Brunel/Brunel Staff by College/Department/Division | - |
pubs.organisational-data | /Brunel/Brunel Staff by College/Department/Division/College of Engineering, Design and Physical Sciences | - |
pubs.organisational-data | /Brunel/Brunel Staff by College/Department/Division/College of Engineering, Design and Physical Sciences/Dept of Mathematics | - |
pubs.organisational-data | /Brunel/Brunel Staff by College/Department/Division/College of Engineering, Design and Physical Sciences/Dept of Mathematics/Mathematical Sciences | - |
pubs.organisational-data | /Brunel/Brunel Staff by Institute/Theme | - |
pubs.organisational-data | /Brunel/Brunel Staff by Institute/Theme/Institute of Environmental, Health and Societies | - |
pubs.organisational-data | /Brunel/Brunel Staff by Institute/Theme/Institute of Environmental, Health and Societies/Health Economics | - |
Appears in Collections: | Brunel OA Publishing Fund Dept of Mechanical and Aerospace Engineering Research Papers |
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Fulltext.pdf | 2.13 MB | Adobe PDF | View/Open |
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