Please use this identifier to cite or link to this item: http://bura.brunel.ac.uk/handle/2438/32452
Title: Learning With Noisy Labels for Industrial Time Series Outlier Detection: A Transformer-Embedded Contrastive Learning Framework
Authors: Fang, J
Wang, Z
Liu, W
Zeng, N
He, Y
Cao, Y
Chen, L
Liu, X
Keywords: industrial time series analysis;learning with noisy labels (LNL);outlier detection;weakly supervised learning
Issue Date: 22-Oct-2025
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Citation: Fang, J. et al. (2025) 'Learning With Noisy Labels for Industrial Time Series Outlier Detection: A Transformer-Embedded Contrastive Learning Framework', IEEE Transactions on Industrial Informatics, 0 (early access), pp. 1 - 11. doi: 10.1109/TII.2025.3616850.
Abstract: In many real-world industrial scenarios, acquiring accurately labeled data are often challenging due to limited resources or unexpected errors. Learning with noisy labels (LNL) has emerged as a significant research topic, aiming to develop reliable deep learning models using noisy-labeled training data. In this article, a novel Transformer-embedded LNL framework with fuzzy-clustering-assisted contrastive learning is developed for industrial time series outlier detection under noisy labels. Specifically, a fuzzy-clustering-assisted contrastive learning strategy is proposed to enhance the robustness of the Transformer encoder against noisy labels by leveraging the intrinsic characteristics of raw data. Furthermore, a dynamic two-stage training scheme is introduced to train the outlier detector. In the first training stage, the Transformer encoder is pretrained through data reconstruction to improve feature extraction capabilities for industrial time series. In the second stage, the outlier detector is jointly trained with the Transformer encoder, incorporating a joint learning strategy. Furthermore, a label-consistency regularization term is designed to enhance the robustness of the outlier detector against noisy labels by minimizing the discrepancy between the outputs of the outlier detector and the clustering algorithm. The proposed framework is applied to industrial time series data collected from a real-world wire arc additive manufacturing (WAAM) process. Experimental results demonstrate that the developed framework outperforms selected representative LNL approaches in WAAM outlier detection under both low and high noise ratios.
URI: https://bura.brunel.ac.uk/handle/2438/32452
DOI: https://doi.org/10.1109/TII.2025.3616850
ISSN: 1551-3203
Other Identifiers: ORCiD: Jingzhong Fang https://orcid.org/0000-0002-3037-3479
ORCiD: Zidong Wang https://orcid.org/0000-0002-9576-7401
ORCiD: Weibo Liu https://orcid.org/0000-0002-8169-3261
ORCiD: Nianyin Zeng https://orcid.org/0000-0002-6957-2942
ORCiD: Linwei Chen https://orcid.org/0009-0008-2328-038X
ORCiD: Xiaohui Liu https://orcid.org/0000-0003-1589-1267
Appears in Collections:Dept of Computer Science Research Papers

Files in This Item:
File Description SizeFormat 
FullText.pdfCopyright © 2025 Institute of Electrical and Electronics Engineers (IEEE). Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works ( https://journals.ieeeauthorcenter.ieee.org/become-an-ieee-journal-author/publishing-ethics/guidelines-and-policies/post-publication-policies/ ).5.27 MBAdobe PDFView/Open


Items in BURA are protected by copyright, with all rights reserved, unless otherwise indicated.