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Title: New inference for constant-stress accelerated life tests with Weibull distribution and progressively type-II censoring
Authors: Wang, BX
Yu, K
Sheng, Z
Keywords: Accelerated life-testing;Censored data;Confidence interval;Maximum likelihood estimation;Progressively censoring;Random variable transformation;Weibull distribution
Issue Date: 2014
Publisher: Institute of Electrical and Electronics Engineers Inc.
Citation: IEEE Transactions on Reliability, 63 (3): 807 - 815, (2014)
Abstract: Constant-stress procedures based on parametric lifetime distributions and models are often used for accelerated life testing in product reliability experiments. Maximum likelihood estimation (MLE) is the typical statistical inference method. This paper presents a new inference method, named the random variable transformation (RVT) method, for Weibull constant-stress accelerated life tests with progressively Type-II right censoring (including ordinary Type-II right censoring). A two-parameter Weibull life distribution with a scale parameter that is a log-linear function of stress is used. RVT inference life distribution parameters and the log-linear function coefficients are provided. Exact confidence intervals for these parameters are also explored. Numerical comparisons of RVT-based estimates to MLE show that the proposed RVT inference is promising, in particular for small sample sizes.
Description: This article has been made available through the Brunel Open Access Publishing Fund.
ISSN: 0018-9529
Appears in Collections:Brunel OA Publishing Fund
Dept of Mechanical Aerospace and Civil Engineering Research Papers

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